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May 15, 2024
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EE 8364 - Statistical Pattern Recognition
Credits: 3
Introduction to various parametric and nonparametric statistical approaches to automatic classification of a set of processes. Topics include Bayes, Neyman-Pearson, minimax, sequential, and nearest-neighbor classifier. Also, estimation of classifier error, parameter estimation, density function estimation, linear discriminant functions, feature selection and evaluation, unsupervised recognition techniques, and clustering analysis. Prerequisite: EE 7375 or equivalent.
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