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Jan 28, 2025
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ECE 8386 - Testing of VLSI Circuits
Credits: 3
The objective of testing is to verify that the manufactured custom chips function correctly according to their specifications. Testing process includes fault modeling, mainly automated simulation, test pattern generation, and testable and self-testing design synthesizing. Structured chips such as memories, PLAs, and FPGAs are also tested for correctness. The course surveys the state-of-the-art test approaches used in industry and in other research environments. Prerequisite: Digital logic design, data structures, and algorithms. Crosslisted as CS 8386.
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